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Development of nanotopography during SIMS characterization of thin films of Ge1-xSnx alloy
M. Secchi, E. Demenev, J. L. Colaux, D. Giubertoni, R. Dell'Anna, E. Iacob, R. M. Gwilliam, Chris Jeynes, M. Bersani
Research output: Contribution to journal › Article › peer-review