Deposition of polysiloxane-like nanofilms onto an aluminium alloy by plasma polymerized hexamethyldisiloxane: characterization by XPS and contact angle measurements

Ammar Azioune; Michaël Marcozzi; V Revello; Jean-Jacques Pireaux

Deposition of polysiloxane-like nanofilms onto an aluminium alloy by plasma polymerized hexamethyldisiloxane: characterization by XPS and contact angle measurements

Ammar Azioune, Michaël Marcozzi, V Revello, Jean-Jacques Pireaux

Research output: Contribution to journal › Article

Original language	English
Pages (from-to)	615-623
Number of pages	9
Journal	Surface and interface analysis
Volume	39
Publication status	Published - 2007

Synthesis, Irradiation and Analysis of Materials (SIAM)
Pierre Louette (Manager), Julien Colaux (Manager), Alexandre Felten (Manager) & Jorge Humberto Mejia Mendoza (Manager)
Technological Platform Synthesis, Irradiation and Analysis of Materials
Facility/equipment: Technological Platform

Cite this

@article{c25ca448a042486aa523f526ef052a15,

title = "Deposition of polysiloxane-like nanofilms onto an aluminium alloy by plasma polymerized hexamethyldisiloxane: characterization by XPS and contact angle measurements",

author = "Ammar Azioune and Micha{\"e}l Marcozzi and V Revello and Jean-Jacques Pireaux",

year = "2007",

language = "English",

volume = "39",

pages = "615--623",

journal = "Surface and interface analysis",

issn = "0142-2421",

publisher = "John Wiley and Sons Ltd",

}

TY - JOUR

T1 - Deposition of polysiloxane-like nanofilms onto an aluminium alloy by plasma polymerized hexamethyldisiloxane: characterization by XPS and contact angle measurements

AU - Azioune, Ammar

AU - Marcozzi, Michaël

AU - Revello, V

AU - Pireaux, Jean-Jacques

PY - 2007

Y1 - 2007

M3 - Article

SN - 0142-2421

VL - 39

SP - 615

EP - 623

JO - Surface and interface analysis

JF - Surface and interface analysis

ER -

Deposition of polysiloxane-like nanofilms onto an aluminium alloy by plasma polymerized hexamethyldisiloxane: characterization by XPS and contact angle measurements

Equipment

Synthesis, Irradiation and Analysis of Materials (SIAM)

Cite this