Projects per year
Abstract
Few-layer graphene (FLG) samples prepared by two methods (chemical vapor deposition (CVD) followed by transfer onto SiO2/Si substrate and mechanical exfoliation) are characterized by combined optical contrast and micro-Raman mapping experiments. We examine the behavior of the integrated intensity ratio of the 2D and G bands (A2D/AG) and of the 2D band width (Γ2D) as a function of the number of layers (N). For our mechanically exfoliated FLG, A2D/AG decreases and Γ2D increases with N as expected for commensurately stacked FLG. For CVD FLG, both similar and opposite behaviors are observed and are ascribed to different stacking orders. For small (respectively, large) relative rotation angle between consecutive layers (θ), the values of the A2D/AG ratio is smaller (respectively, larger) and the 2D band is broader (respectively, narrower) than for single-layer graphene. Moreover, the A2D/AG ratio decreases (respectively, increases) and, conversely, Γ2D increases (respectively, decreases) as a function of N for small (respectively, large) θ. An intermediate behavior has also been found and is interpreted as the presence of both small and large θ within the studied area. These results confirm that neither A2D/AG nor Γ2D are definitive criteria to identify single-layer graphene, or to count N in FLG.
Original language | English |
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Pages (from-to) | 2375-2379 |
Number of pages | 5 |
Journal | Physica Status Solidi b |
Volume | 252 |
Issue number | 11 |
DOIs | |
Publication status | Published - 1 Nov 2015 |
Keywords
- 2D band
- Few-layer graphene
- Graphene
- Optical contrast
- Raman spectroscopy
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Dive into the research topics of 'Dependence of the Raman spectrum characteristics on the number of layers and stacking orientation in few-layer graphene'. Together they form a unique fingerprint.Projects
- 2 Finished
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GRAPHENE: Graphene-driven revolutions in ICT and beyond, FP7 Flagship project Nr 604391
Henrard, L., Lambin, P., Colomer, J., Reckinger, N., Felten, A., Mayer, A., Sporken, R. & Pireaux, J.
1/10/14 → 31/03/16
Project: Research
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Equipment
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High Performance Computing Technology Platform
Benoît Champagne (Manager)
Technological Platform High Performance ComputingFacility/equipment: Technological Platform
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Synthesis, Irradiation and Analysis of Materials (SIAM)
Pierre Louette (Manager), Julien Colaux (Manager), Alexandre Felten (Manager), Tijani Tabarrant (Operator), Frederic COME (Operator) & Paul-Louis Debarsy (Manager)
Technological Platform Synthesis, Irradiation and Analysis of MaterialsFacility/equipment: Technological Platform