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Damage evaluation in graphene underlying atomic layer deposition dielectrics
Xiaohui Tang, Nicolas Reckinger, Olivier Poncelet, Pierre Louette, Ferran Ureña, Hosni Idrissi, Stuart Turner, Damien Cabosart, Jean François Colomer, Jean Pierre Raskin, Benoit Hackens, Laurent A. Francis
Research output: Contribution to journal › Article › peer-review
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