Damage evaluation in graphene underlying atomic layer deposition dielectrics

Xiaohui Tang, Nicolas Reckinger, Olivier Poncelet, Pierre Louette, Ferran Ureña, Hosni Idrissi, Stuart Turner, Damien Cabosart, Jean François Colomer, Jean Pierre Raskin, Benoit Hackens, Laurent A. Francis

Research output: Contribution to journal › Article › peer-review

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- Title(descending)

Electron Microscopy
Jean-Francois Colomer (Manager) & Corry Charlier (Operator)
Technological Platform Morphology - Imaging
Facility/equipment: Equipment
ELISE (XPS and ToF SIMS)
Pierre Louette (Manager)
Facility/equipment: Equipment
Synthesis, Irradiation and Analysis of Materials (SIAM)
Pierre Louette (Manager), Julien Colaux (Manager), Alexandre Felten (Manager), Tijani Tabarrant (Operator), Frederic COME (Operator) & Paul-Louis Debarsy (Manager)
Technological Platform Synthesis, Irradiation and Analysis of Materials
Facility/equipment: Technological Platform