Characterization of ytterbium silicide formed in ultra high vacuum

A. Laszcz, J. Ratajczak, A. Czerwinski, J. Katcki, V. Srot, F. Phillipp, P.A. Van Aken, D.A. Yarekha, Nicolas Reckinger, G. Larrieu, E. Dubois

    Research output: Contribution to conferenceAbstractpeer-review

    Original languageEnglish
    Publication statusPublished - 2009
    Event16th Conference on Microscopy of Semiconducting Material - Oxford, United Kingdom
    Duration: 17 Mar 200920 Mar 2009

    Conference

    Conference16th Conference on Microscopy of Semiconducting Material
    CountryUnited Kingdom
    CityOxford
    Period17/03/0920/03/09

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