Characterization of WO3:Ag films: ToF-SIMS studies of ammonia adsorption

C. Bittencourt, M.P. Felicissimo, A. Felten, L.A.O. Nunes, P. Ivanov, E. Llobet, J.-J. Pireaux, L. Houssiau

Research output: Contribution to journalArticle

Abstract

In this work, the composition and morphology of WO films loaded with different levels of Ag, prepared by screen-printing onto Si substrates and annealed in air were investigated. The TEM micrography showed that the films are grain-like; the grain size increases with the increase of the Ag loading level. The Raman spectroscopy showed the formation of a AgWO bronze structure. XPS and ToF-SIMS results showed that while undergoing annealing, the Ag atoms migrate to the surface forming clusters. The molecular images obtained by ToF-SIMS showed that the NH binds preferentially at the surface of the Ag clusters. No preferential binding site was found for hydrocarbon contamination.
Original languageEnglish
Pages (from-to)21-28
Number of pages8
JournalApplied Surface Science
Volume250
Issue number1-4
DOIs
Publication statusPublished - 31 Aug 2005

Fingerprint Dive into the research topics of 'Characterization of WO<sub>3</sub>:Ag films: ToF-SIMS studies of ammonia adsorption'. Together they form a unique fingerprint.

  • Equipment

  • Cite this