TY - JOUR
T1 - Characterization of insulators by high resolution electron energy loss spectroscopy
T2 - application of a surface potential stabilization technique
AU - Liehr, Michael
AU - Thiry, Paul
AU - Pireaux, Jean-Jacques
AU - Caudano, Roland
PY - 1986
Y1 - 1986
N2 - A surface-potential stabilization technique is described which permits one to take vibrational spectra of excellent quality with high-resolution electron-energy-loss spectroscopy on insulating samples of very different types, such as ionic insulators and polymers. Induced surface conductivity and enhanced secondary-electron emission close to the vacuum level are found to be at the origin of the surface-potential stabilization, which is done by irradiation of the sample with electrons in the keV range. Nonequilibrium carrier densities and mean free paths are estimated from observable Drude damping. Irradiation effects are discussed.
AB - A surface-potential stabilization technique is described which permits one to take vibrational spectra of excellent quality with high-resolution electron-energy-loss spectroscopy on insulating samples of very different types, such as ionic insulators and polymers. Induced surface conductivity and enhanced secondary-electron emission close to the vacuum level are found to be at the origin of the surface-potential stabilization, which is done by irradiation of the sample with electrons in the keV range. Nonequilibrium carrier densities and mean free paths are estimated from observable Drude damping. Irradiation effects are discussed.
U2 - 10.1103/PhysRevB.33.5682
DO - 10.1103/PhysRevB.33.5682
M3 - Article
SN - 0163-1829
VL - 33
SP - 5682
EP - 5697
JO - Physical review. B, Condensed matter
JF - Physical review. B, Condensed matter
ER -