Characterization of insulators by high resolution electron energy loss spectroscopy: application of a surface potential stabilization technique

Research output: Contribution to journalArticle

Original languageFrench
Pages (from-to)5682-5697
Number of pages16
JournalPhysical Review B
Volume33
Publication statusPublished - 1986

Cite this

@article{c12b5e3119ce4977adfe6512c70c4609,
title = "Characterization of insulators by high resolution electron energy loss spectroscopy: application of a surface potential stabilization technique",
author = "Michael Liehr and Paul Thiry and Jean-Jacques Pireaux and Roland Caudano",
year = "1986",
language = "Fran{\cc}ais",
volume = "33",
pages = "5682--5697",
journal = "Physical Review B - Condensed Matter and Materials Physics",
issn = "2469-9950",
publisher = "American Institute of Physics Publising LLC",

}

TY - JOUR

T1 - Characterization of insulators by high resolution electron energy loss spectroscopy: application of a surface potential stabilization technique

AU - Liehr, Michael

AU - Thiry, Paul

AU - Pireaux, Jean-Jacques

AU - Caudano, Roland

PY - 1986

Y1 - 1986

M3 - Article

VL - 33

SP - 5682

EP - 5697

JO - Physical Review B - Condensed Matter and Materials Physics

JF - Physical Review B - Condensed Matter and Materials Physics

SN - 2469-9950

ER -