Characterization of Ag doped SnO2 for gas sensing application

A. Ouerdane; M. Ghaffour; Z. Hachoun; M. Abdelkrim; M. Bedrouni; Y. Caudano

doi:10.18311/jsst/2018/14738

Characterization of Ag doped SnO₂ for gas sensing application

A. Ouerdane, M. Ghaffour, Z. Hachoun, M. Abdelkrim, M. Bedrouni, Y. Caudano

University of Namur

Research output: Contribution to journal › Article › peer-review

Abstract

We used Transmission Electron Microscopy TEM, Energy Dispersive X-ray (EDX), X-ray Diffraction (XRD) and impedance spectroscopy to study SnO₂ doped by sputtered Ag atoms on its surface. The morphology of the surface texture showed large Ag islands in SnO₂ bulk when the system was submitted to heating. These results were well confirmed by EDX spectrum, TEM scanning micrograph and impedance spectroscopy. Furthermore, TRIM software was used to show the effects of nuclear and electron stopping range on optical properties of the crystal Ag-SnO₂ and the depth reached by Ag into SnO₂ bulk.

Original language	English
Pages (from-to)	66-73
Number of pages	8
Journal	Journal of Surface Science and Technology
Volume	34
Issue number	1-2
DOIs	https://doi.org/10.18311/jsst/2018/14738
Publication status	Published - 1 Jun 2018

Keywords

Ag-SnO
Doping
EDX
TEM
TRIM
XRD

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10.18311/jsst/2018/14738

Cite this

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title = "Characterization of Ag doped SnO2 for gas sensing application",

abstract = "We used Transmission Electron Microscopy TEM, Energy Dispersive X-ray (EDX), X-ray Diffraction (XRD) and impedance spectroscopy to study SnO2 doped by sputtered Ag atoms on its surface. The morphology of the surface texture showed large Ag islands in SnO2 bulk when the system was submitted to heating. These results were well confirmed by EDX spectrum, TEM scanning micrograph and impedance spectroscopy. Furthermore, TRIM software was used to show the effects of nuclear and electron stopping range on optical properties of the crystal Ag-SnO2 and the depth reached by Ag into SnO2 bulk.",

keywords = "Ag-SnO, Doping, EDX, TEM, TRIM, XRD",

author = "A. Ouerdane and M. Ghaffour and Z. Hachoun and M. Abdelkrim and M. Bedrouni and Y. Caudano",

year = "2018",

month = jun,

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doi = "10.18311/jsst/2018/14738",

language = "English",

volume = "34",

pages = "66--73",

journal = "Journal of Surface Science and Technology",

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T1 - Characterization of Ag doped SnO2 for gas sensing application

AU - Ouerdane, A.

AU - Ghaffour, M.

AU - Hachoun, Z.

AU - Abdelkrim, M.

AU - Bedrouni, M.

AU - Caudano, Y.

PY - 2018/6/1

Y1 - 2018/6/1

N2 - We used Transmission Electron Microscopy TEM, Energy Dispersive X-ray (EDX), X-ray Diffraction (XRD) and impedance spectroscopy to study SnO2 doped by sputtered Ag atoms on its surface. The morphology of the surface texture showed large Ag islands in SnO2 bulk when the system was submitted to heating. These results were well confirmed by EDX spectrum, TEM scanning micrograph and impedance spectroscopy. Furthermore, TRIM software was used to show the effects of nuclear and electron stopping range on optical properties of the crystal Ag-SnO2 and the depth reached by Ag into SnO2 bulk.

AB - We used Transmission Electron Microscopy TEM, Energy Dispersive X-ray (EDX), X-ray Diffraction (XRD) and impedance spectroscopy to study SnO2 doped by sputtered Ag atoms on its surface. The morphology of the surface texture showed large Ag islands in SnO2 bulk when the system was submitted to heating. These results were well confirmed by EDX spectrum, TEM scanning micrograph and impedance spectroscopy. Furthermore, TRIM software was used to show the effects of nuclear and electron stopping range on optical properties of the crystal Ag-SnO2 and the depth reached by Ag into SnO2 bulk.

KW - Ag-SnO

KW - Doping

KW - EDX

KW - TEM

KW - TRIM

KW - XRD

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DO - 10.18311/jsst/2018/14738

M3 - Article

AN - SCOPUS:85049974392

SN - 0970-1893

VL - 34

SP - 66

EP - 73

JO - Journal of Surface Science and Technology

JF - Journal of Surface Science and Technology

IS - 1-2

ER -

Characterization of Ag doped SnO₂ for gas sensing application

Abstract

Keywords

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Morphology - Imaging

Optics, Lasers and spectroscopy

Physical Chemistry and characterization(PC2)

Cite this

Characterization of Ag doped SnO2 for gas sensing application

Abstract

Keywords

Access to Document

Other files and links

Embargoed Document

Fingerprint

Equipment

Morphology - Imaging

Optics, Lasers and spectroscopy

Physical Chemistry and characterization(PC2)

Cite this

Characterization of Ag doped SnO₂ for gas sensing application