Abstract
We used Transmission Electron Microscopy TEM, Energy Dispersive X-ray (EDX), X-ray Diffraction (XRD) and impedance spectroscopy to study SnO2 doped by sputtered Ag atoms on its surface. The morphology of the surface texture showed large Ag islands in SnO2 bulk when the system was submitted to heating. These results were well confirmed by EDX spectrum, TEM scanning micrograph and impedance spectroscopy. Furthermore, TRIM software was used to show the effects of nuclear and electron stopping range on optical properties of the crystal Ag-SnO2 and the depth reached by Ag into SnO2 bulk.
Original language | English |
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Pages (from-to) | 66-73 |
Number of pages | 8 |
Journal | Journal of Surface Science and Technology |
Volume | 34 |
Issue number | 1-2 |
DOIs | |
Publication status | Published - 1 Jun 2018 |
Keywords
- Ag-SnO
- Doping
- EDX
- TEM
- TRIM
- XRD
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Morphology - Imaging
Cecchet, F. (Manager) & Renard, H.-F. (Manager)
Technological Platform Morphology - ImagingFacility/equipment: Technological Platform
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Optics, Lasers and spectroscopy
Lepere, M. (Manager)
Technological Platform Optics, Lasers and spectroscopyFacility/equipment: Technological Platform
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Physical Chemistry and characterization(PC2)
Wouters, J. (Manager), Aprile, C. (Manager) & Fusaro, L. (Manager)
Technological Platform Physical Chemistry and characterizationFacility/equipment: Technological Platform