Cesium/xenon dual beam depth profiling with TOF-SIMS: Measurement and modeling of M⁺, MCs⁺, and M₂Cs₂⁺  yields

Chemistry

• Concentration 100%
• Depth Profiling 100%
• Xenon 100%
• Cesium 100%
• Time-of-Flight Secondary Ion Mass Spectrometry 100%
• Secondary Ion Mass Spectroscopy 60%
• Atom 40%
• Surface 40%
• Ion 40%
• Tunneling 40%
• Chemical Element 40%
• Optimization 20%
• Procedure 20%
• Sample 20%
• Energy 20%
• Aqueous Solution 20%
• Ionization 20%
• Anion 20%
• Environment 20%
• Positive Ion 20%
• Alkali 20%
• Cluster Ion 20%
• Work Function 20%

Medicine and Dentistry

• Measurement 100%
• Secondary Ion Mass Spectrometry 100%
• Cesium 100%
• Xenon 100%
• Element 80%
• Concentration Effect 20%
• Anion 20%
• Alkali 20%

Physics

• Ion 100%
• Caesium 100%
• Ratios 33%
• Environment 33%
• Probability Theory 33%
• Competition 33%
• Ionization 33%
• Work Functions 33%
• Positive Ion 33%
• Negative Ion 33%