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Abstract
Mutation analysis is a popular test assessment method. It relies on the mutation score, which indicates how many mutants are revealed by a test suite. Yet, there are mutants whose behaviour is equivalent to the original system, wasting analysis resources and preventing the satisfaction of the full (100%) mutation score. For finite behavioural models, the Equivalent Mutant Problem (EMP) can be addressed through language equivalence of non-deterministic finite automata, which is a well-studied, yet computationally expensive, problem in automata theory. In this paper, we report on our preliminary assessment of a state-of-the-art exact language equivalence tool to handle the EMP against 3 models of size up to 15,000 states on 1170 mutants. We introduce random and mutation-biased simulation heuristics as baselines for comparison. Results show that the exact approach is often more than ten times faster in the weak mutation scenario. For strong mutation, our biased simulations are faster for models larger than 300 states. They can be up to 1,000 times faster while limiting the error of misclassifying non-equivalent mutants as equivalent to 10% on average. We therefore conclude that the approaches can be combined for improved efficiency.
Original language | English |
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Title of host publication | Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017 |
Place of Publication | Tokyo, Japan |
Publisher | IEEE |
Pages | 424-429 |
Number of pages | 6 |
ISBN (Electronic) | 9781509060313 |
DOIs | |
Publication status | Published - 15 May 2017 |
Event | 10th IEEE International Conference on Software Testing, Verification and Validation (ICST 2017) - Tokyo, Japan Duration: 13 Mar 2017 → 18 Mar 2017 Conference number: 10 http://aster.or.jp/conference/icst2017/ |
Publication series
Name | 2017 IEEE International Conference on Software Testing, Verification and Validation (ICST) |
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Conference
Conference | 10th IEEE International Conference on Software Testing, Verification and Validation (ICST 2017) |
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Abbreviated title | ICST 2017 |
Country/Territory | Japan |
City | Tokyo |
Period | 13/03/17 → 18/03/17 |
Internet address |
Keywords
- Model-Based Mutation Analysis
- Automata Language Equivalence
- Random Simulations
- Model-based mutation analysis
- Random simulations
- Automata language equivalence
Fingerprint
Dive into the research topics of 'Automata Language Equivalence vs. Simulations for Model-based Mutant Equivalence: An Empirical Evaluation'. Together they form a unique fingerprint.Projects
- 2 Finished
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Thesis-X-Devroey: Behavioural Model Based Testing of Software Product Lines
Devroey, X. (Researcher), Heymans, P. (CoI), Schobbens, P. Y. (CoI) & Perrouin, G. (Researcher)
1/09/11 → 30/08/17
Project: PHD
Activities
- 1 Participation in conference
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10th IEEE International Conference on Software Testing, Verification and Validation (ICST 2017)
Devroey, X. (Speaker)
13 Mar 2017 → 18 Mar 2017Activity: Participating in or organising an event types › Participation in conference
Student theses
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Behavioural model-based testing of software product lines
Devroey, X. (Author), Schobbens, P.-Y. (Supervisor), Heymans, P. (Supervisor), Englebert, V. (President), Baudry, B. (Jury), Cohen, M. B. (Jury), Legay, A. (Jury) & Perrouin, G. (Jury), 30 Aug 2017Student thesis: Doc types › Doctor of Sciences
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