Atomic scale analysis of defect structures and properties in III-nitride materials by Z-contrast imaging and EELS in STEM

Y. Xin, N.D. Browning, S.J. Pennycook, Sivalingam Sivananthan, Robert Sporken, F Omnés, B. Beaumont, J.P. Faurie, P. Gibart

    Research output: Contribution to journalArticlepeer-review

    Original languageEnglish
    Pages (from-to)1081
    JournalJ. Electron. Mat.
    Volume28
    Publication statusPublished - 1999

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