Analyses Auger et XPS de l'interface de TiO/Si

K. Grigorov, R. Sporken, J. Riga, R. Caudano, D. Bouchier, G. I. Grigorov

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Cite this

@article{8299416d346949b19af1fbce9bad3f30,

title = "Analyses Auger et XPS de l'interface de TiO/Si",

author = "K. Grigorov and R. Sporken and J. Riga and R. Caudano and D. Bouchier and Grigorov, {G. I.}",

year = "1996",

language = "English",

volume = "52",

pages = "121--124",

journal = "Le Vide",

issn = "1266-0167",

publisher = "Societe Francaise du Vide",

number = "279",

}

TY - JOUR

T1 - Analyses Auger et XPS de l'interface de TiO/Si

AU - Grigorov, K.

AU - Sporken, R.

AU - Riga, J.

AU - Caudano, R.

AU - Bouchier, D.

AU - Grigorov, G. I.

PY - 1996

Y1 - 1996

UR - http://www.scopus.com/inward/record.url?scp=19044366133&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:19044366133

SN - 1266-0167

VL - 52

SP - 121

EP - 124

JO - Le Vide

JF - Le Vide

IS - 279

ER -