Analyses Auger et XPS de l'interface de TiO/Si

K. Grigorov, R. Sporken, J. Riga, R. Caudano, D. Bouchier, G. I. Grigorov

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)121-124
Number of pages4
JournalVide: Science, Technique et Applications
Volume52
Issue number279
Publication statusPublished - 1996

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