An electrical evaluation method for the silicidation of silicon nanowires

X. Tang, N. Reckinger, V. Bayot, D. Flandre, E. Dubois, D.A. Yarekha, G. Larrieu, A. Lecestre, J. Ratajczak, N. Breil, V. Passi, J.-P. Raskin

    Research output: Contribution to journal › Article › peer-review

    Fingerprint

    Dive into the research topics of 'An electrical evaluation method for the silicidation of silicon nanowires'. Together they form a unique fingerprint.

    Chemistry

    Chemical Engineering

    Material Science