AFM and XPS characterization of the Si(111) surface after thermal treatment

B. Lamontagne, D. Guay, D. Roy, Robert Sporken, Roland Caudano

    Research output: Contribution to journalArticlepeer-review

    Original languageEnglish
    Pages (from-to)481-487
    JournalAppl. Surf. Science
    Volume90
    Publication statusPublished - 1995

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