Accurate electronics calibration for particle backscattering spectrometry

Julien L. Colaux, Chris Jeynes

Research output: Contribution to journalArticlepeer-review

Abstract

Rutherford backscattering spectrometry (RBS) is a non-destructive thin film analytical technique of the highest absolute accuracy which, when used for elemental depth profiling, depends at first order on the gain of the pulse-height spectrometry system. We show here for the first time how this gain can be reliably and robustly determined at about 0.1%. This journal is

Original languageEnglish
Pages (from-to)3096-3104
Number of pages9
JournalAnalytical Methods
Volume7
Issue number7
DOIs
Publication statusPublished - 7 Apr 2015
Externally publishedYes

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