Abstract
In Model Based Testing (MBT), test cases are generated automatically from a partial representation of expected behaviour of the System Under Test (SUT) (i.e., the model). For most industrial systems, it is impossible to generate all the possible test cases from the model. The test engineer recourse to generation algorithms that maximize a given coverage criterion, a metric indicating the percentage of possible behaviours of the SUT covered by the test cases. Our previous work redefined classical Transition Systems (TSs) criteria for SPLs, using Featured Transition Systems (FTSs), a mathematical structure to compactly represent the behaviour of a SPL, as model for test case generation. In this paper, we provide one all-states coverage driven generation algorithm and discuss its scalability and efficiency with respect to random generation. All-states and random generation are compared on fault-seeded FTSs.
| Original language | English |
|---|---|
| Title of host publication | ACM International Conference Proceeding Series |
| Place of Publication | Florence, Italy |
| Publisher | ACM Press |
| Pages | 86-93 |
| Number of pages | 8 |
| Volume | 2 |
| ISBN (Print) | 9781450327398 |
| DOIs | |
| Publication status | Published - 15 Sep 2014 |
| Event | 18th International Software Product Line Conference, SPLC 2014 - Florence, Italy Duration: 15 Sep 2014 → 19 Sep 2014 |
Publication series
| Name | SPLC '14 |
|---|---|
| Publisher | ACM |
Conference
| Conference | 18th International Software Product Line Conference, SPLC 2014 |
|---|---|
| Country | Italy |
| City | Florence |
| Period | 15/09/14 → 19/09/14 |
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Keywords
- Model-based testing
- Software product line
- Test case generation
Cite this
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Abstract test case generation for behavioural testing of software product lines. / Devroey, Xavier; Perrouin, Gilles; Schobbens, Pierre-Yves.
ACM International Conference Proceeding Series. Vol. 2 Florence, Italy : ACM Press, 2014. p. 86-93 (SPLC '14).Research output: Contribution in Book/Catalog/Report/Conference proceeding › Conference contribution
TY - GEN
T1 - Abstract test case generation for behavioural testing of software product lines
AU - Devroey, Xavier
AU - Perrouin, Gilles
AU - Schobbens, Pierre-Yves
PY - 2014/9/15
Y1 - 2014/9/15
N2 - In Model Based Testing (MBT), test cases are generated automatically from a partial representation of expected behaviour of the System Under Test (SUT) (i.e., the model). For most industrial systems, it is impossible to generate all the possible test cases from the model. The test engineer recourse to generation algorithms that maximize a given coverage criterion, a metric indicating the percentage of possible behaviours of the SUT covered by the test cases. Our previous work redefined classical Transition Systems (TSs) criteria for SPLs, using Featured Transition Systems (FTSs), a mathematical structure to compactly represent the behaviour of a SPL, as model for test case generation. In this paper, we provide one all-states coverage driven generation algorithm and discuss its scalability and efficiency with respect to random generation. All-states and random generation are compared on fault-seeded FTSs.
AB - In Model Based Testing (MBT), test cases are generated automatically from a partial representation of expected behaviour of the System Under Test (SUT) (i.e., the model). For most industrial systems, it is impossible to generate all the possible test cases from the model. The test engineer recourse to generation algorithms that maximize a given coverage criterion, a metric indicating the percentage of possible behaviours of the SUT covered by the test cases. Our previous work redefined classical Transition Systems (TSs) criteria for SPLs, using Featured Transition Systems (FTSs), a mathematical structure to compactly represent the behaviour of a SPL, as model for test case generation. In this paper, we provide one all-states coverage driven generation algorithm and discuss its scalability and efficiency with respect to random generation. All-states and random generation are compared on fault-seeded FTSs.
KW - Model-based testing
KW - Software product line
KW - Test case generation
UR - http://www.scopus.com/inward/record.url?scp=84907833970&partnerID=8YFLogxK
U2 - 10.1145/2647908.2655971
DO - 10.1145/2647908.2655971
M3 - Conference contribution
SN - 9781450327398
VL - 2
T3 - SPLC '14
SP - 86
EP - 93
BT - ACM International Conference Proceeding Series
PB - ACM Press
CY - Florence, Italy
ER -