Abstract test case generation for behavioural testing of software product lines

Research output: Contribution in Book/Catalog/Report/Conference proceedingConference contribution

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Abstract

In Model Based Testing (MBT), test cases are generated automatically from a partial representation of expected behaviour of the System Under Test (SUT) (i.e., the model). For most industrial systems, it is impossible to generate all the possible test cases from the model. The test engineer recourse to generation algorithms that maximize a given coverage criterion, a metric indicating the percentage of possible behaviours of the SUT covered by the test cases. Our previous work redefined classical Transition Systems (TSs) criteria for SPLs, using Featured Transition Systems (FTSs), a mathematical structure to compactly represent the behaviour of a SPL, as model for test case generation. In this paper, we provide one all-states coverage driven generation algorithm and discuss its scalability and efficiency with respect to random generation. All-states and random generation are compared on fault-seeded FTSs.

Original languageEnglish
Title of host publicationACM International Conference Proceeding Series
Place of PublicationFlorence, Italy
PublisherACM Press
Pages86-93
Number of pages8
Volume2
ISBN (Print)9781450327398
DOIs
Publication statusPublished - 15 Sep 2014
Event18th International Software Product Line Conference, SPLC 2014 - Florence, Italy
Duration: 15 Sep 201419 Sep 2014

Publication series

NameSPLC '14
PublisherACM

Conference

Conference18th International Software Product Line Conference, SPLC 2014
CountryItaly
CityFlorence
Period15/09/1419/09/14

Fingerprint

Testing
Scalability
Engineers

Keywords

  • Model-based testing
  • Software product line
  • Test case generation

Cite this

Devroey, X., Perrouin, G., & Schobbens, P-Y. (2014). Abstract test case generation for behavioural testing of software product lines. In ACM International Conference Proceeding Series (Vol. 2, pp. 86-93). (SPLC '14). Florence, Italy: ACM Press. https://doi.org/10.1145/2647908.2655971
Devroey, Xavier ; Perrouin, Gilles ; Schobbens, Pierre-Yves. / Abstract test case generation for behavioural testing of software product lines. ACM International Conference Proceeding Series. Vol. 2 Florence, Italy : ACM Press, 2014. pp. 86-93 (SPLC '14).
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Devroey, X, Perrouin, G & Schobbens, P-Y 2014, Abstract test case generation for behavioural testing of software product lines. in ACM International Conference Proceeding Series. vol. 2, SPLC '14, ACM Press, Florence, Italy, pp. 86-93, 18th International Software Product Line Conference, SPLC 2014, Florence, Italy, 15/09/14. https://doi.org/10.1145/2647908.2655971

Abstract test case generation for behavioural testing of software product lines. / Devroey, Xavier; Perrouin, Gilles; Schobbens, Pierre-Yves.

ACM International Conference Proceeding Series. Vol. 2 Florence, Italy : ACM Press, 2014. p. 86-93 (SPLC '14).

Research output: Contribution in Book/Catalog/Report/Conference proceedingConference contribution

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Devroey X, Perrouin G, Schobbens P-Y. Abstract test case generation for behavioural testing of software product lines. In ACM International Conference Proceeding Series. Vol. 2. Florence, Italy: ACM Press. 2014. p. 86-93. (SPLC '14). https://doi.org/10.1145/2647908.2655971