Abstract test case generation for behavioural testing of software product lines

Xavier Devroey; Gilles Perrouin; Pierre-Yves Schobbens

doi:10.1145/2647908.2655971

Abstract test case generation for behavioural testing of software product lines

Xavier Devroey, Gilles Perrouin, Pierre-Yves Schobbens

Research output: Contribution in Book/Catalog/Report/Conference proceeding › Conference contribution

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Abstract

In Model Based Testing (MBT), test cases are generated automatically from a partial representation of expected behaviour of the System Under Test (SUT) (i.e., the model). For most industrial systems, it is impossible to generate all the possible test cases from the model. The test engineer recourse to generation algorithms that maximize a given coverage criterion, a metric indicating the percentage of possible behaviours of the SUT covered by the test cases. Our previous work redefined classical Transition Systems (TSs) criteria for SPLs, using Featured Transition Systems (FTSs), a mathematical structure to compactly represent the behaviour of a SPL, as model for test case generation. In this paper, we provide one all-states coverage driven generation algorithm and discuss its scalability and efficiency with respect to random generation. All-states and random generation are compared on fault-seeded FTSs.

Original language	English
Title of host publication	ACM International Conference Proceeding Series
Place of Publication	Florence, Italy
Publisher	ACM Press
Pages	86-93
Number of pages	8
Volume	2
ISBN (Print)	9781450327398
DOIs	https://doi.org/10.1145/2647908.2655971
Publication status	Published - 15 Sep 2014
Event	18th International Software Product Line Conference, SPLC 2014 - Florence, Italy Duration: 15 Sep 2014 → 19 Sep 2014

Publication series

Name	SPLC '14
Publisher	ACM

Conference

Conference	18th International Software Product Line Conference, SPLC 2014
Country	Italy
City	Florence
Period	15/09/14 → 19/09/14

Keywords

Model-based testing
Software product line
Test case generation

Access to Document

10.1145/2647908.2655971

SPLAT14-xdeSubmitted manuscript, 489 KB

Link to publication in Scopus

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Thesis-X-Devroey: Behavioural Model Based Testing of Software Product Lines
DEVROEY, X., HEYMANS, P., SCHOBBENS, P. & PERROUIN, G.
1/09/11 → 30/08/17
Project: PHD

1 Participation in conference

1st Workshop on Software Product Line Analysis Tools (SPLat'14)
Xavier Devroey (Speaker)
16 Sep 2014
Activity: Participating in or organising an event types › Participation in conference

VIBeS Case Studies: Featured Transition Systems and Feature Models
DEVROEY, X. (Creator), University of Namur, Oct 2020
DOI: 10.5281/zenodo.4105899
Dataset

Behavioural model-based testing of software product lines
Author: Devroey, X., 30 Aug 2017
Supervisor: Schobbens, P. (Supervisor), Heymans, P. (Supervisor), Englebert, V. (President), Baudry, B. (External person) (Jury), Cohen, M. B. (External person) (Jury), Legay, A. (Jury) & Perrouin, G. (Jury)
Student thesis: Doc types › Doctor of Sciences

File

Cite this

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abstract = "In Model Based Testing (MBT), test cases are generated automatically from a partial representation of expected behaviour of the System Under Test (SUT) (i.e., the model). For most industrial systems, it is impossible to generate all the possible test cases from the model. The test engineer recourse to generation algorithms that maximize a given coverage criterion, a metric indicating the percentage of possible behaviours of the SUT covered by the test cases. Our previous work redefined classical Transition Systems (TSs) criteria for SPLs, using Featured Transition Systems (FTSs), a mathematical structure to compactly represent the behaviour of a SPL, as model for test case generation. In this paper, we provide one all-states coverage driven generation algorithm and discuss its scalability and efficiency with respect to random generation. All-states and random generation are compared on fault-seeded FTSs.",

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N2 - In Model Based Testing (MBT), test cases are generated automatically from a partial representation of expected behaviour of the System Under Test (SUT) (i.e., the model). For most industrial systems, it is impossible to generate all the possible test cases from the model. The test engineer recourse to generation algorithms that maximize a given coverage criterion, a metric indicating the percentage of possible behaviours of the SUT covered by the test cases. Our previous work redefined classical Transition Systems (TSs) criteria for SPLs, using Featured Transition Systems (FTSs), a mathematical structure to compactly represent the behaviour of a SPL, as model for test case generation. In this paper, we provide one all-states coverage driven generation algorithm and discuss its scalability and efficiency with respect to random generation. All-states and random generation are compared on fault-seeded FTSs.

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Abstract test case generation for behavioural testing of software product lines

Abstract

Publication series

Conference

Keywords

Access to Document

Thesis-X-Devroey: Behavioural Model Based Testing of Software Product Lines

1st Workshop on Software Product Line Analysis Tools (SPLat'14)

VIBeS Case Studies: Featured Transition Systems and Feature Models

Behavioural model-based testing of software product lines

Cite this