A method to overcome the diffraction limit in infrared microscopy using standing waves in an attenuated total reflection configuration

Nordine Hendaoui, Aladin Mani, Ning Liu, Syed M. Tofail, Christophe Silien, André Peremans

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    Abstract

    A method is proposed to overcome the diffraction limit of spatial resolution in infrared microscopy. To achieve this, standing waves in an attenuated total reflection configuration were generated to spatially modulate the absorbance of adsorbate vibrational transitions. A numerical simulation was undertaken. It showed that chemical imaging with a spatial resolution of approximately 100 nm is achievable in the case of self-assembled patterns (ofoctdecyltrichlorosilane [CH3-(CH2)17-SiCl3]), when probing the methyl modes located near 3.5 micrometres.

    Original languageEnglish
    Pages (from-to)574-579
    Number of pages6
    JournalOptics Communications
    Volume382
    DOIs
    Publication statusPublished - 1 Jan 2017

    Keywords

    • ATR configuration
    • Far field
    • Infrared microscopy
    • Label free
    • Super-resolution

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