Sputtering matter onto storage plates for quantitative investigations against fraud or organic and inorganic samples (storing matter)

Project: Research

Description

Develop a new instrument (sputtering of matter on a storing plate) and use SIMS and XPS techniques in order to quantify the presence of organic and inorganic elements at the trace level.
AcronymSTOMAT
StatusFinished
Effective start/end date1/07/0130/06/05

Keywords

  • depth profile
  • XPS
  • quantitative analysis
  • fraud
  • Sputtering
  • SIMS