Project Details
Description
Develop a new instrument (sputtering of matter on a storing plate) and use SIMS and XPS techniques in order to quantify the presence of organic and inorganic elements at the trace level.
| Acronym | STOMAT |
|---|---|
| Status | Finished |
| Effective start/end date | 1/07/01 → 30/06/05 |
Keywords
- depth profile
- XPS
- quantitative analysis
- fraud
- Sputtering
- SIMS
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