Depth profiling of hybrid multilayers using ToF-SIMS: from model samples to photonic devices

Houssiau, Laurent (PI)
Noel, Celine (Researcher)

Project: PHD

Status	Finished
Effective start/end date	1/09/13 → 8/04/19

Attachment to an Research Institute in UNAMUR

NISM

Synthesis, Irradiation and Analysis of Materials (SIAM)
Louette, P. (Manager), Colaux, J. (Manager), Felten, A. (Manager), Tabarrant, T. (Operator), COME, F. (Operator) & Debarsy, P.-L. (Manager)
Technological Platform Synthesis, Irradiation and Analysis of Materials
Facility/equipment: Technological Platform