A novel method for the characterization of interfaces in composite materials : application to the study of the deposition of ceramics on metals

Project: Research

Project Details


This project aims at understanding the formation of interfaces between dissimilar materials. Such interfaces will be produced with a thickness gradient and analyzed by scanning Auger microscopy. We shall start with the study of III-V nitride films and ext
Effective start/end date1/07/9431/08/99


  • GaN
  • interface formation
  • electronic structure
  • AlN
  • BN
  • nitrides


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