A novel method for the characterization of interfaces in composite materials : application to the study of the deposition of ceramics on metals

Project: Research

Project Details

Description

This project aims at understanding the formation of interfaces between dissimilar materials. Such interfaces will be produced with a thickness gradient and analyzed by scanning Auger microscopy. We shall start with the study of III-V nitride films and ext
StatusFinished
Effective start/end date1/07/9431/08/99

Keywords

  • GaN
  • interface formation
  • electronic structure
  • AlN
  • BN
  • nitrides