INIS
surfaces
92%
graphene
89%
substrates
71%
layers
53%
cadmium tellurides
53%
molecular beam epitaxy
52%
films
50%
scanning tunneling microscopy
46%
zinc oxides
40%
growth
39%
interfaces
34%
nitrogen
25%
silicon carbides
25%
epitaxy
23%
doped materials
23%
energy
21%
molecules
21%
annealing
20%
atoms
20%
comparative evaluations
20%
photoemission
19%
charges
18%
photoemission spectroscopy
17%
gallium arsenides
17%
nanostructures
17%
antimony 111
17%
islands
14%
valence
14%
coatings
13%
resolution
13%
images
13%
origin
13%
x-ray photoelectron spectroscopy
13%
defects
12%
superlattices
12%
deposition
12%
electronic structure
12%
absorption
12%
photons
12%
size
12%
interactions
12%
carbon
12%
low energy electron diffraction
12%
x radiation
12%
density
12%
diffusion
12%
semiconductor materials
11%
cadmium sulfides
11%
gallium nitrides
11%
electric fields
11%
Material Science
Graphene
100%
Molecular Beam Epitaxy
94%
Film
70%
X-Ray Photoelectron Spectroscopy
46%
ZnO
40%
Density
36%
Heterojunction
35%
Gallium Arsenide
30%
Crystalline Material
28%
Electronic Property
26%
Photoemission Spectroscopy
25%
Epitaxy
24%
Electronic Structure
22%
Superlattice
19%
Thin Films
18%
Nitrogen-Doped Graphene
18%
Monolayers
17%
Annealing
16%
Band Offset
15%
Optical Property
14%
Solar Cell
14%
Oxidation Reaction
14%
Auger Electron Spectroscopy
14%
Low-Energy Electron Diffraction
13%
Oxide Compound
13%
Single Crystal
13%
Stainless Steel
12%
Photoluminescence
12%
Chemical Vapor Deposition
12%
Heteroepitaxy
11%
Molybdenum
11%
Steel Sheet
11%
Raman Spectroscopy
11%
Surface Morphology
11%
Silver
10%
Palladium
10%
Doping (Additives)
10%
Scanning Electron Microscopy
10%
Reflection High-Energy Electron Diffraction
9%
Sol-Gel
8%
Electron Diffraction
8%
Angle-Resolved Photoemission Spectroscopy
8%
Epilayers
8%
Carrier Lifetime
8%
Silicon
7%
Dielectric Material
7%
High Resolution Electron Energy Loss Spectroscopy
7%
Ab Initio Simulation
7%
Grain Boundary
7%
Ab Initio Calculation
7%
Keyphrases
Quantum Size Effect
8%
Electron Spectroscopy
5%
CdS-CdTe
5%
Heterostructure
5%
Secondary Ion Mass Spectrometry
5%
XPS Characterization
5%
Nitrogen-doped Graphene
5%
Localized Charges
5%
State Transfer
5%
Hydrogen Transfer
5%
Indium
5%
Magnetic Properties of Interfaces
5%
Interface Structure
5%
Selective Growth
5%
Demixing
5%
Valence Band Offset
5%
Interface Electronic Properties
5%
Electronic Structure Properties
5%
Ge(001)
5%
Absorption Mechanism
5%
Mesoporous Silica Nanocarriers
5%
Co-ZnO
5%
Self-forming Barrier
5%
Organic Inhibitor
5%
Mild Steel
5%
Hydrochloric Acid Medium
5%
InSb
5%
Two-photon Absorption
5%
Thermally Activated Processes
5%
Random Laser
5%
MoTe2
5%
AlSb
5%
Sb(111)
5%
Vibrational Bands
5%
Electronic Energy Loss
5%
Electron Distribution
5%
Ge(111)
5%
Distribution Curve
5%
Oxidation Model
5%
Rubidium Fluoride
5%
Thermal Barrier Layer
5%
Composite System
5%
CexZr1-xO2
5%
Reducing Conditions
5%
XPS Study
5%
Si Composite
5%
Ceria-zirconia Mixed Oxide
5%
Multimedia Materials
5%
Magnesium Oxidation
5%
Oxygen Exposure
5%