Chemistry
Adsorption
16%
Alkane
30%
Aluminum Oxide
13%
Amide
13%
Angle Resolved Ultraviolet Photoelectron Spectroscopy
11%
Atom
9%
Attenuated Total Reflectance Spectroscopy
13%
Binding Energy
9%
CNDO Calculation
12%
Conduction Band
13%
Copolymer
13%
Copper
27%
Core Level
13%
Dielectric Material
24%
Dioxygen
11%
Electron Energy Loss Spectroscopy
20%
Electron Particle
65%
Electron Spectroscopy
17%
Electron Tunneling Spectroscopy
13%
Electronic Band Structure
20%
Electronic State
33%
Energy
50%
Ethane
9%
Ethylene
27%
Gas
29%
Group
12%
High Resolution Electron Energy Loss Spectroscopy
86%
Liquid Film
13%
Macrocycle
13%
Magnesium
13%
Methane
9%
Nonconductor
13%
Optical Constant
18%
Oxidation Reaction
13%
Photoemission
40%
Polyethylene Terephthalate
13%
Polymer
31%
Procedure
20%
Propane
9%
Relaxation
40%
Scattering
21%
Solid
18%
Spectra
28%
Spectroscopy
13%
Structure
15%
Surface
9%
Valance Band
9%
Valence Band
51%
X-Ray
13%
X-Ray Photoelectron Spectroscopy
43%
Material Science
Adsorption
9%
Air
20%
Aluminum
18%
Amorphous Material
13%
Argon
7%
Auger Electron Spectroscopy
6%
Boron
13%
Coating
13%
Density
15%
Devices
13%
Diamond
13%
Dielectric Material
48%
Electron Energy Loss Spectrometry
37%
Electronic Structure
20%
Electronics
31%
Film
21%
Fullerene
13%
Gallium Arsenide
13%
Hardness
8%
High Resolution Electron Energy Loss Spectroscopy
100%
III-V Semiconductor
6%
Infrared Spectroscopy
9%
Ion Implantation
18%
Laser
30%
Layered Material
6%
Low-Energy Electron Diffraction
11%
Magnesium Oxide
9%
Mechanical Strength
13%
Metal
13%
Modification of Polymer Surface
6%
Monolayers
22%
Oscillator
13%
Oxidation Reaction
13%
Oxide Compound
32%
Oxynitride
13%
Photoemission Spectroscopy
33%
Polyethylene
31%
Polymer Films
13%
Polypropylene
27%
Polystyrene
13%
Rubidium
13%
Semiconductor Material
13%
Silicon
43%
Surface
98%
Surface Phonons
13%
Temperature
12%
Thin Film Characterization
13%
Tin
9%
Ultra Violet Photoemission Spectroscopy
29%
Water
13%
Engineering
Alkane
13%
Angle of Incidence
6%
Band Structure
9%
Barrier Height
13%
Dielectrics
11%
Distribution Curve
13%
Electron Energy
45%
Electronics
9%
Energy Dissipation
40%
Epitaxial Film
6%
Excimer Laser
13%
Film Property
6%
Hard X-Rays
6%
Hardness Value
6%
High Hardness
6%
Hydrogenation
6%
III-V Semiconductor
6%
Individual Component
6%
Intrinsic Stress
6%
Linear Dependence
13%
Metal Contact
13%
Optical Phonon
6%
Performed Measurement
6%
Plasmon Excitation
13%
Processing
6%
Quantum Efficiency
13%
Ray Photoelectron Spectroscopy
7%
Residual Strain
6%
Resonance Frequency
6%
Situ Study
13%
Sputtering Yield
13%
Strain
6%
Structural Modification
13%
Superlattice
6%
Transmissions
7%