Chemistry
High Resolution Electron Energy Loss Spectroscopy
86%
Electron Particle
65%
Valence Band
51%
Energy
50%
X-Ray Photoelectron Spectroscopy
43%
Relaxation
40%
Photoemission
40%
Electronic State
33%
Polymer
31%
Alkane
30%
Gas
29%
Spectra
28%
Copper
27%
Ethylene
27%
Dielectric Material
24%
Scattering
21%
Procedure
20%
Electron Energy Loss Spectroscopy
20%
Electronic Band Structure
20%
Optical Constant
18%
Solid
18%
Electron Spectroscopy
17%
Adsorption
16%
Structure
15%
Spectroscopy
13%
Amide
13%
Copolymer
13%
Macrocycle
13%
Core Level
13%
Liquid Film
13%
Aluminum Oxide
13%
Attenuated Total Reflectance Spectroscopy
13%
Nonconductor
13%
Electron Tunneling Spectroscopy
13%
Oxidation Reaction
13%
Polyethylene Terephthalate
13%
Magnesium
13%
Conduction Band
13%
X-Ray
13%
Group
12%
CNDO Calculation
12%
Angle Resolved Ultraviolet Photoelectron Spectroscopy
11%
Dioxygen
11%
Surface
9%
Atom
9%
Binding Energy
9%
Methane
9%
Propane
9%
Ethane
9%
Valance Band
9%
Material Science
High Resolution Electron Energy Loss Spectroscopy
100%
Surface
98%
Dielectric Material
48%
Silicon
43%
Electron Energy Loss Spectrometry
37%
Photoemission Spectroscopy
33%
Oxide Compound
32%
Polyethylene
31%
Electronics
31%
Laser
30%
Ultra Violet Photoemission Spectroscopy
29%
Polypropylene
27%
Monolayers
22%
Film
21%
Air
20%
Electronic Structure
20%
Aluminum
18%
Ion Implantation
18%
Density
15%
Mechanical Strength
13%
Oxynitride
13%
Rubidium
13%
Oscillator
13%
Thin Film Characterization
13%
Surface Phonons
13%
Polystyrene
13%
Gallium Arsenide
13%
Semiconductor Material
13%
Water
13%
Polymer Films
13%
Oxidation Reaction
13%
Fullerene
13%
Metal
13%
Devices
13%
Diamond
13%
Coating
13%
Amorphous Material
13%
Boron
13%
Temperature
12%
Low-Energy Electron Diffraction
11%
Infrared Spectroscopy
9%
Adsorption
9%
Magnesium Oxide
9%
Tin
9%
Hardness
8%
Argon
7%
III-V Semiconductor
6%
Modification of Polymer Surface
6%
Auger Electron Spectroscopy
6%
Layered Material
6%
Engineering
Electron Energy
45%
Energy Dissipation
40%
Alkane
13%
Distribution Curve
13%
Structural Modification
13%
Excimer Laser
13%
Plasmon Excitation
13%
Quantum Efficiency
13%
Linear Dependence
13%
Situ Study
13%
Sputtering Yield
13%
Barrier Height
13%
Metal Contact
13%
Dielectrics
11%
Band Structure
9%
Electronics
9%
Transmissions
7%
Ray Photoelectron Spectroscopy
7%
Strain
6%
Individual Component
6%
Hard X-Rays
6%
III-V Semiconductor
6%
Performed Measurement
6%
Epitaxial Film
6%
Optical Phonon
6%
Residual Strain
6%
Processing
6%
Superlattice
6%
Resonance Frequency
6%
Angle of Incidence
6%
Intrinsic Stress
6%
Hydrogenation
6%
High Hardness
6%
Hardness Value
6%
Film Property
6%