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Renaud Hubert

  • 10 Citations
  • 2 h-Index
20022006
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Engineering & Materials Science

Secondary ion mass spectrometry
Rhodium
Cesium
Doppler effect
Sputtering
Xenon
Glassy carbon
Tantalum
Oncology
Proton irradiation
X rays
Thin films
High temperature applications
Diffusion barriers
Ionization
Substrates
Protons
Photons
Ions
Vacuum
Temperature
Physical vapor deposition
Calibration
Atoms

Physics & Astronomy

Chemistry and Materials

rhodium
glassy carbon
tantalum
cesium
xenon

Aerospace Sciences

secondary ion mass spectrometry

Engineering

sputtering
proton irradiation
ionization
x rays
direct current

General

profiles
thin films
configurations
simulation

Physics

protons
photons
vacuum
temperature
ions

Life Sciences

cancer

Chemical Compounds

Secondary ion mass spectrometry
Cesium
Xenon
Sputtering
Thin films
Ions
Oncology
Physical vapor deposition
Atoms