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Paul Bertrand

  • 11 Citations
  • 1 h-Index
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  • 26 Similar Profiles
Depth profiling Chemical Compounds
Argon Chemical Compounds
Secondary ion mass spectrometry Chemical Compounds
secondary ion mass spectrometry Physics & Astronomy
Sputtering Chemical Compounds
amino acids Physics & Astronomy
Amino acids Engineering & Materials Science
Multilayers Chemical Compounds

Research Output 2013 2013

  • 11 Citations
  • 1 h-Index
  • 1 Article

TOF-SIMS depth profiling of multilayer amino-acid films using large Argon cluster Arn+, C60+ and Cs+ sputtering ions: A comparative study

Wehbe, N., Tabarrant, T., Brison, J., Mouhib, T., Delcorte, A., Bertrand, P., Moellers, R., Niehuis, E. & Houssiau, L., 1 Jan 2013, In : Surface and interface analysis. 45, 1, p. 178-180 3 p.

Research output: Contribution to journalArticle

Depth profiling
Secondary ion mass spectrometry
secondary ion mass spectrometry