Paul BERTRAND

Source: Scopus
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14 Citations
1 h-Index
1 Article

TOF-SIMS depth profiling of multilayer amino-acid films using large Argon cluster Arn+, C60+ and Cs+ sputtering ions: A comparative study
Wehbe, N., Tabarrant, T., Brison, J., Mouhib, T., Delcorte, A., Bertrand, P., Moellers, R., Niehuis, E. & Houssiau, L., 1 Jan 2013, In : Surface and interface analysis. 45, 1, p. 178-180 3 p.
Research output: Contribution to journal › Article › peer-review

TOF-SIMS depth profiling of multilayer amino-acid films using large Argon cluster Arn+, C60+ and Cs+ sputtering ions: A comparative study