Nimer Wehbe

  • 247 Citations
  • 10 h-Index
20032014
If you made any changes in Pure these will be visible here soon.

Fingerprint Dive into the research topics where Nimer Wehbe is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 17 Similar Profiles
Depth profiling Chemical Compounds
Secondary ion mass spectrometry Chemical Compounds
Ions Chemical Compounds
secondary ion mass spectrometry Physics & Astronomy
Sputtering Chemical Compounds
Cesium Chemical Compounds
Fullerenes Chemical Compounds
Argon Chemical Compounds

Research Output 2003 2014

  • 247 Citations
  • 10 h-Index
  • 20 Article

Comparison of fullerene and large argon clusters for the molecular depth profiling of amino acid multilayers

Wehbe, N., Mouhib, T., Delcorte, A., Bertrand, P., Moellers, R., Niehuis, E. & Houssiau, L., 1 Jan 2014, In : Analytical and Bioanalytical Chemistry. 406, 1, p. 201-211 11 p.

Research output: Contribution to journalArticle

Fullerenes
Depth profiling
Argon
Silicon
Sputtering

In-depth diffusion of oxygen into LDPE exposed to an Ar–O2 atmospheric post-discharge: a complementary approach between AR-XPS and Tof-SIMS techniques

Abou Rich, S., Leroy, P., Dufour, T., Wehbe, N., Houssiau, L. & Reniers, F., 5 Feb 2014, In : Surface and interface analysis. 46, 3, p. 164-174 11 p., 10.1002/sia.403.

Research output: Contribution to journalArticle

Cesium
phenylalanine
Depth profiling
Secondary ion mass spectrometry
organic materials

Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: Comparative evaluation of three sputtering beams

Mouhib, T., Poleunis, C., Wehbe, N., Michels, J. J., Galagan, Y., Houssiau, L., Bertrand, P. & Delcorte, A., 21 Nov 2013, In : Analyst. 138, 22, p. 6801-6810 10 p.

Research output: Contribution to journalArticle

Secondary Ion Mass Spectrometry
Butyric Acid
Depth profiling
Secondary ion mass spectrometry
Artifacts

TOF-SIMS depth profiling of multilayer amino-acid films using large Argon cluster Arn+, C60+ and Cs+ sputtering ions: A comparative study

Wehbe, N., Tabarrant, T., Brison, J., Mouhib, T., Delcorte, A., Bertrand, P., Moellers, R., Niehuis, E. & Houssiau, L., 1 Jan 2013, In : Surface and interface analysis. 45, 1, p. 178-180 3 p.

Research output: Contribution to journalArticle

Depth profiling
Argon
Secondary ion mass spectrometry
secondary ion mass spectrometry
Sputtering

Activities 2005 2009

  • 21 Participation in conference
  • 2 Participation in workshop, seminar, course

ECASIA'09 - 13 European Conference on Applications of Surface and Interface analysis , Antalya, Turkey.

Nimer Wehbe (Poster)
18 Oct 200923 Oct 2009

Activity: Participating in or organising an event typesParticipation in conference

The 17th International Conference on Secondary Ion Mass Spectrometry , Toronto, Canada.

Nimer Wehbe (Contributor)
14 Sep 200918 Sep 2009

Activity: Participating in or organising an event typesParticipation in conference

The 17th International Conference on Secondary Ion Mass Spectrometry , Toronto, Canada.

Nimer Wehbe (Contributor)
14 Sep 200918 Sep 2009

Activity: Participating in or organising an event typesParticipation in conference

The 17th International Conference on Secondary Ion Mass Spectrometry , Toronto, Canada.

Nimer Wehbe (Contributor)
14 Sep 200918 Sep 2009

Activity: Participating in or organising an event typesParticipation in conference

The 17th International Conference on Secondary Ion Mass Spectrometry , Toronto, Canada.

Nimer Wehbe (Contributor)
14 Sep 200918 Sep 2009

Activity: Participating in or organising an event typesParticipation in conference