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Marcella Felicissimo

  • 63 Citations
  • 5 h-Index
20042010
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Research Output 2004 2010

  • 63 Citations
  • 5 h-Index
  • 8 Article
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Article
2010

SEM, EPR and ToF-SIMS analyses applied to unravel the technology employed for pottery-making by pre-colonial Indian tribes from Pantanal, Brazil

Felicissimo, M. P., Peixoto, J. L., Bittencourt, C., Tomasi, R., Houssiau, L., Pireaux, J-J. & Rodrigues-Filho, U. P., 1 Sep 2010, In : Journal of Archaeological Science. 37, 9, p. 2179-2187 9 p.

Research output: Contribution to journalArticle

ethnic group
Brazil
Electron Paramagnetic Resonance
Pottery-making
Tribes
2005

Characterization of WO3:Ag films: ToF-SIMS studies of ammonia adsorption

Bittencourt, C., Felicissimo, M. P., Felten, A., Nunes, L. A. O., Ivanov, P., Llobet, E., Pireaux, J-J. & Houssiau, L., 31 Aug 2005, In : Applied Surface Science. 250, 1-4, p. 21-28 8 p.

Research output: Contribution to journalArticle

Secondary ion mass spectrometry
Ammonia
Adsorption
Screen printing
Bronze

PIXE and PIGE analysis of precolonial pottery from Patanal-MS, Brazil

Felicissimo, M., Demortier, G., Peixoto, J., Barbosa, MS., Pireaux, J-J. & Rodrigues-Filho, UP., 2005, In : Journal of Radioanalytical and nuclear Chemistry. 267, 1, p. 209-217 9 p.

Research output: Contribution to journalArticle

Study of annatto from Bixa orellana seeds: An application of time-of-flight secondary ion mass spectrometry

Bittencourt, C., Felicissimo, M. P., Pireaux, J-J. & Houssiau, L., 1 Apr 2005, In : Spectroscopy Europe. 17, 2, p. 16-22 7 p.

Research output: Contribution to journalArticle

Secondary ion mass spectrometry
secondary ion mass spectrometry
Seed
seeds
inert atmosphere

ToF-SIMS characterization of thermal modifications of bixin from Bixa orellana fruit

Bittencourt, C., Felicissimo, M. P., Pireaux, J-J. & Houssiau, L., 10 Aug 2005, In : Journal of Agricultural and Food Chemistry. 53, 16, p. 6195-6200 6 p.

Research output: Contribution to journalArticle

Bixaceae
Secondary Ion Mass Spectrometry
Bixa orellana
Secondary ion mass spectrometry
Fruits
2004
Bixaceae
Secondary Ion Mass Spectrometry
X-ray photoelectron spectroscopy
Bixa orellana
Photoelectron Spectroscopy

ToF-SIMS applied to probe bixin in Bixa orellana seeds

Houssiau, L., Felicissimo, M., Bittencourt, C. & Pireaux, J. J., 15 Jun 2004, In : Applied Surface Science. 231-232, p. 416-419 4 p.

Research output: Contribution to journalArticle

Secondary ion mass spectrometry
Seed
Ions
Food Coloring Agents
Xylenes

X-ray photoemission spectroscopy and secondary-ion mass spectroscopy applied to the compositional study of pre-colonial pottery from Pantanal, Brazil

Felicissimo, M. P., Peixoto, J. L. S., Tomasi, R., Azioune, A., Pireaux, J-J., Houssiau, L. & Filho, U. P. R., 11 Nov 2004, In : Philosophical Magazine. 84, 32, p. 3483-3496 14 p.

Research output: Contribution to journalArticle

Brazil
photoelectric emission
mass spectroscopy
spectroscopy
ions