Photo of Julien Colaux
  • Source: Scopus
  • Calculated based on no. of publications stored in Pure and citations from Scopus
1984 …2020

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  • Thin film depth profiling by ion beam analysis

    Jeynes, C. & Colaux, J. L., 7 Nov 2016, In : Analyst. 141, 21, p. 5944-5985 42 p.

    Research output: Contribution to journalReview articlepeer-review

    Open Access
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