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Research Output 1973 2020

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XPS/AFM study of the PET surface modified by oxygen and carbon dioxide plasmas: Al/PET adhesion

Le, T. Q., Pireaux, J-J., Caudano, R., Leclère, P. & Lazzaroni, R., 1998, In : Journal of adhesion science and technology. 12, 9, p. 999-1023 25 p.

Research output: Contribution to journalArticle

XPS/AFM study of thermally evaporated Aluminium/Polycarbonate interface

Massaro, C., Le Quoc, T. & Pireaux, J-J., 1994, In : Surface and interface analysis. 21, p. 425-429 5 p.

Research output: Contribution to journalArticle

XPS and SEM evaluation of six Chemical and Physiclal Techniques for cleaning of contaminated titanium implants

Mouhyi, J., Sennerby, L., Louette, P., Pireaux, J-J., Dourov, N., Nammour, S. & van Reck, J., 1998, In : Clin. Oral Impl. Res.. 9, p. 185-194 10 p.

Research output: Contribution to journalArticle

XPS data analysis via wavelets and Fourier transform

Charles, C., Leclerc, G., Louette, P., Pireaux, J-J. & Rasson, J-P., 2004, In : Surface and interface analysis. 36, p. 71-80 10 p.

Research output: Contribution to journalArticle

XPS depth profiling of derivatized amine and anhydride plasma polymers: Evidence of limitations of the derivatization approach

Manakhov, A., Michlíček, M., Felten, A., Pireaux, J-J., Nečas, D. & Zajíčková, L., 1 Feb 2017, In : Applied Surface Science. 394, p. 578-585 8 p.

Research output: Contribution to journalArticle

Depth profiling
Anhydrides
Amines
Polymers
X ray photoelectron spectroscopy
Cesium
phenylalanine
Depth profiling
Secondary ion mass spectrometry
organic materials

XPS study of CO adsorption on simple metals

Pireaux, J-J., Ghijsen, J., Verbist, J. & Caudano, R., 1978, In : Japanese Journal of Applied Physics. 17, 2, p. 264-267 4 p.

Research output: Contribution to journalArticle

XPS surface characterization of Titanium dental implants after failure of osseointegration

Yan, H., Le Quoc, T., Pireaux, J-J., Arijs, A., Philippart, C. & Dourov, N., 1994, In : Surfaces in Biomaterials. p. 205-210 6 p.

Research output: Contribution to journalArticle

X-ray photoelectron spectroscopic study of pi electron delocalization in polyphenyls - a comparison with acenes and polystyrene

Pireaux, J-J., Riga, J., Caudano, R., Verbist, J., Boutique, J. P. & Gobillon, Y., 1981, In : Synthetic Metals . 4, Issue 2, p. 99-112 14 p.

Research output: Contribution to journalArticle

X-Ray photoelectron spectroscopy applied to polymers

Pireaux, J-J., 1994, In : Brazil. J. Vac. Applic.. 13, p. 2-20 19 p.

Research output: Contribution to journalArticle

X-ray photoelectron spectroscopy characterization of high-k dielectric Al2O3 and HfO2 layers deposited on SiO2/Si surface

Vitchev, R., Pireaux, J-J., Conard, T., Bender, H., Wolstenholme, J. & Defranoux, C., 2004, In : Applied Surface Science. 235, p. 21-25 5 p.

Research output: Contribution to journalArticle

X-ray photoelectron spectroscopy of an ethylene-tetrafluoroethylene copolymer

Pireaux, J-J., Riga, J., Caudano, R., Verbist, J., GOBILLON, N. V., Delhalle, J., DELHALLE, N. V. & André, J-M., 1979, In : J. Polym. Sci. Polym. Chem. Ed.. 17, p. 1175-1186 12 p.

Research output: Contribution to journalArticle

X-ray photoemission spectroscopy and secondary-ion mass spectroscopy applied to the compositional study of pre-colonial pottery from Pantanal, Brazil

Felicissimo, M. P., Peixoto, J. L. S., Tomasi, R., Azioune, A., Pireaux, J-J., Houssiau, L. & Filho, U. P. R., 11 Nov 2004, In : Philosophical Magazine. 84, 32, p. 3483-3496 14 p.

Research output: Contribution to journalArticle

Brazil
photoelectric emission
mass spectroscopy
spectroscopy
ions