No photo of Jérémy Brison

Jérémy Brison

  • 177 Citations
  • 7 h-Index
20002013
If you made any changes in Pure these will be visible here soon.

Fingerprint Dive into the research topics where Jérémy Brison is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 51 Similar Profiles
Secondary ion mass spectrometry Engineering & Materials Science
Cesium Engineering & Materials Science
Depth profiling Engineering & Materials Science
Xenon Engineering & Materials Science
secondary ion mass spectrometry Physics & Astronomy
Sputtering Engineering & Materials Science
cesium Physics & Astronomy
xenon Physics & Astronomy

Projects 2000 2007

Research Output 2004 2013

  • 177 Citations
  • 7 h-Index
  • 17 Article

TOF-SIMS depth profiling of multilayer amino-acid films using large Argon cluster Arn+, C60+ and Cs+ sputtering ions: A comparative study

Wehbe, N., Tabarrant, T., Brison, J., Mouhib, T., Delcorte, A., Bertrand, P., Moellers, R., Niehuis, E. & Houssiau, L., 1 Jan 2013, In : Surface and interface analysis. 45, 1, p. 178-180 3 p.

Research output: Contribution to journalArticle

Depth profiling
Argon
Secondary ion mass spectrometry
secondary ion mass spectrometry
Sputtering
bionics
Depth profiling
Ions
ions
Secondary ion mass spectrometry

Cesium redeposition artifacts during low energy ToF-SIMS depth profiling

Vitchev, R. G., Brison, J. & Houssiau, L., 15 Jun 2009, In : Applied Surface Science. 255, 17, p. 7586-7589 4 p.

Research output: Contribution to journalArticle

Cesium
Depth profiling
Secondary ion mass spectrometry
Sputtering
Ions
Depth profiling
Xenon
Cesium
Secondary ion mass spectrometry
cesium
Depth profiling
Xenon
Cesium
Secondary ion mass spectrometry
cesium

Activities 2002 2008

  • 8 Participation in conference
  • 1 Participation in workshop, seminar, course

SIMS International XIV

Jérémy Brison (Contributor)
28 Apr 2008

Activity: Participating in or organising an event typesParticipation in conference

Nanobeams meeting

Jérémy Brison (Contributor)
10 Nov 2006

Activity: Participating in or organising an event typesParticipation in workshop, seminar, course

5th internal symposium on atomic level characterizations for new materials and devices ALC'05

Jérémy Brison (Contributor)
4 Dec 20059 Dec 2005

Activity: Participating in or organising an event typesParticipation in conference

15th International Conference on Secondary Ion Mass Spectrometry (SIMS XV)

Jérémy Brison (Contributor)
12 Sep 200516 Sep 2005

Activity: Participating in or organising an event typesParticipation in conference

SIMS International XV

Jérémy Brison (Contributor)
12 Sep 200516 Sep 2005

Activity: Participating in or organising an event typesParticipation in conference

Thesis

Le co-sputtering de césium et de xénon : une nouvelle approche pour une méthode de profilage quantitative en ToF-SIMS

Author: Brison, J., 2003

Supervisor: Houssiau, L. (Supervisor)

Student thesis: DEA typesDEA in Physics and material Chemistry

On the understanding of ionization and cluster formation processes during ToF-SIMS depth profiling by Co-sputtering cesium and xenon

Author: Brison, J., 2007

Supervisor: Houssiau, L. (Supervisor), Lucas, S. (Jury), Pireaux, J. (Jury), Bertrand, P. (External person) (Jury) & Niehuis, E. (External person) (Jury)

Student thesis: Doc typesDoctor of Sciences

Optimisation de dépôts de TiO2 sur verre et caractérisation Tof-SIMS

Author: Douhard, B., 2005

Supervisor: Pireaux, J. (Supervisor), Lepere, M. (Jury), Brison, J. (Jury) & Houssiau, L. (Supervisor)

Student thesis: Master typesMaster in Chemistry