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Emrick Briand

  • 2 Citations
  • 1 h-Index
20132013
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  • 14 Similar Profiles
Depth profiling Engineering & Materials Science
Beam plasma interactions Engineering & Materials Science
Ion beams Engineering & Materials Science
ion beams Physics & Astronomy
Silica Engineering & Materials Science
silicon dioxide Physics & Astronomy
Secondary ion mass spectrometry Engineering & Materials Science
secondary ion mass spectrometry Physics & Astronomy

Research Output 2013 2013

  • 2 Citations
  • 1 h-Index
  • 1 Article

Understanding of CO2 interaction with thermally grown SiO2 on Si using IBA depth profiling techniques

Deokar, G., D'Angelo, M., Briand, E. & Deville Cavellin, C., 1 Jun 2013, In : Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. 304, p. 67-71 5 p.

Research output: Contribution to journal › Article

Depth profiling
Beam plasma interactions
Ion beams
ion beams
Silica