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Depth profiling of hybrid multilayers using ToF-SIMS: from model samples to photonic devices
Author: Noel, C., 8 Apr 2019Supervisor: Houssiau, L. (Supervisor), Cecchet, F. (President), Busby, Y. (Jury), Delcorte, A. (External person) (Jury), Galtayries, A. (External person) (Jury) & Bernard, L. (External person) (Jury)
Student thesis: Doc types › Doctor of Sciences
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