• 22 Citations
  • 2 h-Index
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  • 13 Similar Profiles
Secondary ion mass spectrometry Chemical Compounds
phenylalanine Physics & Astronomy
Phosphorylcholine Chemical Compounds
Argon Chemical Compounds
Ion bombardment Engineering & Materials Science
X ray photoelectron spectroscopy Chemical Compounds
Phenylalanine Chemical Compounds
Fibronectins Chemical Compounds

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Research Output 2014 2018

  • 22 Citations
  • 2 h-Index
  • 4 Article
  • 1 Conference contribution

Aging effects in interface-engineered perovskite solar cells with 2D nanomaterials: A depth profile analysis

Busby, Y., Agresti, A., Pescetelli, S., Di Carlo, A., Noel, C., Pireaux, J-J. & Houssiau, L., 1 Sep 2018, In : Materials Today Energy. 9, p. 1-10 10 p.

Research output: Contribution to journalArticle

Nanostructured materials
Aging of materials

XPS depth profiles of organo lead halide layers and full perovskite solar cells by variable-size argon clusters

Busby, Y., Noël, C., Pescetelli, S., Agresti, A., Di Carlo, A., Pireaux, J. J. & Houssiau, L., 1 Jan 2018, Physical Chemistry of Semiconductor Materials and Interfaces XVII. Bronstein, H. A., Deschler, F. & Kirchartz, T. (eds.). SPIE, Vol. 10724. 1072408

Research output: Contribution in Book/Catalog/Report/Conference proceedingConference contribution

X-ray Spectroscopy
Solar Cells

Interaction of phosphorylcholine with fibronectin coatings: Surface characterization and biological performances

Montaño-Machado, V., Noël, C., Chevallier, P., Turgeon, S., Houssiau, L., Pauthe, E., Pireaux, J-J. & Mantovani, D., 28 Feb 2017, In : Applied Surface Science. 396, p. 1613-1622 10 p.

Research output: Contribution to journalArticle

Fluorocarbon Polymers

Investigation of Cs surface layer formation in Cs-SIMS with TOF-MEIS and SIMS

Houssiau, L., Noël, C., Mine, N., Jung, K. W., Min, W. J. & Moon, D. W., 2014, In : Surface and interface analysis. 46, S1, p. 22-24 3 p.

Research output: Contribution to journalArticle

Secondary ion mass spectrometry
Ion bombardment
secondary ion mass spectrometry