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Fingerprint Dive into the research topics where Alexandre Felten is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 5 Similar Profiles
Graphite Chemical Compounds
Carbon Nanotubes Chemical Compounds
Graphene Engineering & Materials Science
Carbon nanotubes Engineering & Materials Science
Plasmas Chemical Compounds
carbon nanotubes Physics & Astronomy
Gold Chemical Compounds
graphene Physics & Astronomy

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Projects 2002 2024

Research Output 2005 2019

Hybrid perovskites depth profiling with variable-size argon clusters and monatomic ions beams

Noël, C., Pescetelli, S., Agresti, A., Franquet, A., Spampinato, V., Felten, A., di Carlo, A., Houssiau, L. & Busby, Y., 1 Mar 2019, In : Materials. 12, 5, 726.

Research output: Contribution to journalArticle

Open Access
Depth profiling
Argon
perovskites
Ion beams
Sputtering

Restoring self-limited growth of single-layer graphene on copper foil via backside coating

Reckinger, N., Casa, M., Scheerder, J. E., Keijers, W., Paillet, M., Huntzinger, J-R., Haye, E., Felten, A., Van de Vondel, J., Sarno, M., Henrard, L. & Colomer, J-F., 2019, In : Nanoscale. 11, 11, p. 5094-5101 8 p.

Research output: Contribution to journalArticle

Graphite
Graphene
Metal foil
Copper
Coatings

Chemical Bonds between Laser Welded Aluminum and Polyamide?

Hirchenhahn, P., Al Sayyad, A., Bardon, J., Felten, A., Plapper, P. & Houssiau, L., 18 Sep 2018.

Research output: Contribution to conferenceOther

22 Downloads (Pure)

Determining the number of layers in few-layer graphene by combining Raman spectroscopy and optical contrast

Bayle, M., Reckinger, N., Felten, A., Landois, P., Lancry, O., Dutertre, B., Colomer, J. F., Zahab, A. A., Henrard, L., Sauvajol, J. L. & Paillet, M., 2018, In : Journal of Raman Spectroscopy. 49, 1, p. 36 - 45 10 p.

Research output: Contribution to journalArticle

File
Graphite
Graphene
Raman spectroscopy
Silicon
Lasers

Restoring self-limited growth of single-layer graphene on copper foil via backside coating

Reckinger, N., Casa, M., Scheerder, J. E., Keijers, W., Paillet, M., Huntzinger, J-R., Haye, E., Felten, A., Vondel, J. V. D., Sarno, M., Henrard, L. & Colomer, J-F., 15 Aug 2018, In : ArXiv pre-print. 40 p.

Research output: Contribution to journalArticle

Open Access
File

Activities 2001 2015

  • 25 Participation in conference
  • 19 Research/Teaching in a external institution
  • 6 Participation in workshop, seminar, course
  • 1 Participation to a Symposium, a study Day

ISPC 22

Alexandre Felten (Poster)
5 Jul 201510 Jul 2015

Activity: Participating in or organising an event typesParticipation in conference

MRS Spring Meeting 2015

Alexandre Felten (Speaker)
6 Apr 201510 Apr 2015

Activity: Participating in or organising an event typesParticipation in conference

Kick-Off meeting. EU graphene Flahship

Alexandre Felten (Contributor)
22 Oct 201423 Oct 2014

Activity: Participating in or organising an event typesParticipation to a Symposium, a study Day

University of Manchester

Alexandre Felten (Visiting researcher)
10 Jun 201413 Jun 2014

Activity: Visiting an external institution typesResearch/Teaching in a external institution

Graphene 2014

Alexandre Felten (Poster)
6 May 20149 May 2014

Activity: Participating in or organising an event typesParticipation in conference

Thesis

Electronic and structural properties of plasma functionalized and metal decorated carbon nanotubes

Author: Felten, A., 4 May 2007

Supervisor: Pireaux, J. (Supervisor), Lambin, P. (Jury), Lucas, S. (Jury), Bittencourt, C. (External person) (Jury) & DRUBE, W. (External person) (Jury)

Student thesis: Doc typesDoctor of Sciences

Etude de métallofullerènes par spectroscopie de photoémission

Author: Felten, A., 2002

Supervisor: Pireaux, J. (Supervisor) & Rudolf, P. (External person) (Co-Supervisor)

Student thesis: Master typesMaster in Physics

Equipment

Irradiation
Linear accelerators
Secondary ion mass spectrometry
Plasmas
Depth profiling