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ADRIEN NELIS

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Thesis

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Caractérisation de la diffusion de ⁷⁴Ge⁺, co-implanté avec un excès de ²⁸Si⁺ dans une couche de dioxyde de silicium sur un substrat de silicium

Author: Nelis, A., Sep 2014

Supervisor: Terwagne, G. (Jury)

Student thesis: Master types › Master in Physics

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