Research Output 1969 2020

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Review article
2020
Nanostructured materials
Surface treatment
Nanocomposites
Plasmas
Powders
2016

Thin film depth profiling by ion beam analysis

Jeynes, C. & Colaux, J. L., 7 Nov 2016, In : Analyst. 141, 21, p. 5944-5985 42 p.

Research output: Contribution to journalReview article

Depth profiling
Rutherford backscattering spectroscopy
Spectrometry
Ion beams
Spectrum Analysis