Visite de l'entreprise Ion-TOF

Houssiau, L. (Participant)

Activity: Participating in or organising an event typesParticipation in conference

Description

Démonstration de la machine ToF-SIMS IV, analyse d'écahtillons test
Period29 Nov 2000 - 30 Nov 2000
Event typeOutside journey
LocationMünster, Allemagne