The 17th International Conference on Secondary Ion Mass Spectrometry , Toronto, Canada.

Nimer Wehbe (Contributor)

Activity: Participating in or organising an event typesParticipation in conference

Description

Oral contribution: "Depth profiling of amino-acids, sugar and vitamins using ion beams of energy ranging from 150 eV up to 1500 eV" N. Wehbe, N. Mine, L. Houssiau.
Period14 Sep 200918 Sep 2009
Event typeConference
LocationToronto, Canada