The 17th International Conference on Secondary Ion Mass Spectrometry , Toronto, Canada.

Wehbe, N. (Contributor)

Activity: Participating in or organising an event typesParticipation in conference


Oral contribution: "Depth profiling of amino-acids, sugar and vitamins using ion beams of energy ranging from 150 eV up to 1500 eV" N. Wehbe, N. Mine, L. Houssiau.
Period14 Sep 2009 - 18 Sep 2009
Event typeConference
LocationToronto, Canada