The 17th International Conference on Secondary Ion Mass Spectrometry , Toronto, Canada.

Nimer Wehbe (Contributor)

Activity: Participating in or organising an event typesParticipation in conference

Description

Oral Contribution: "Molecular depth profiling with reactive ions, or why chemistry matters in sputtering". L. Houssiau, N. Mine, N. Wehbe.
Period14 Sep 200918 Sep 2009
Event typeConference
LocationToronto, Canada