The 16th International Conference on Secondary Ion Mass Spectrometry , Kanazawa, Japan.

Nimer Wehbe (Contributor)

University of Namur

Activity: Participating in or organising an event types › Participation in conference

Description

Oral contribution: "Secondary Ion Yield Evolutions Induced by Noble Metal Deposition using Atomic and Polyatomic Projectiles in Static-SIMS". N. Wehbe, A. Delcorte, A. Heile, H. F. Arlinghaus, P. Bertrand.

Period	29 Oct 2007 → 2 Nov 2007
Event type	Conference
Location	Kanazawa, Japan.Show on map