SIMS XVI

Houssiau, L. (Contributor)

Activity: Participating in or organising an event typesParticipation in conference

Description

Molecular depth profiling of polymers with very low energy ions, communication orale. Co-auteurs : B. Douhard et N. Mine.Depth distribution of Cs implanted into Si at steady-state during dual beam ToF-SIMS profiling, poster. Co
Period28 Oct 20072 Nov 2007
Event typeConference
LocationKanazawa, Japon