SIMS International XV

  • Jérémy Brison (Contributor)

Activity: Participating in or organising an event types › Participation in conference

Description

Cesium/Xenon dual beam depth profiling: velocity of the sputtered atom and ionization probability, communication orale.
Period12 Sept 2005 → 16 Sept 2005
Event typeConference
LocationManchester, Royaume-UniShow on map