sims europe 2012

Houssiau, L. (Contributor)

Activity: Participating in or organising an event typesParticipation in conference

Description

2 conferences : "The cesium effect during the depth profiling of organic layers investigated using TOF-SIMS and XPS" "Comparison of cesium, fullerene and large argon clusters for the molecular depth profiling of amino-acid multilayers"
Period9 Sep 201212 Sep 2012
Event typeConference
LocationMünster, Germany