SIMS Europe 2008

Houssiau, L. (Contributor)

Activity: Participating in or organising an event typesParticipation in conference


Conference donnee par N. Mine (doctorant): "ToF-SIMS low energy depth profiling of polymers with Cesium: a sputtering yield point of view", N. Mine, L. Houssiau Poster intitule (presente par L. Houssiau): Cesium redeposition artifacts during low energy
Period14 Sep 200816 Sep 2008
Event typeConference
LocationMunster, Allemagne