SIMS Europe 2006

  • Roumen Vitchev (Contributor)

Activity: Participating in or organising an event types › Participation in conference

Description

Study of the transient effects during ToF-SIMS depth profiling of Si. Co-auteurs : J. Brison et L. Houssiau.
Period24 Sept 2006 → 26 Sept 2006
Event typeConference
LocationMunster (Germany)Show on map