SIMS Europe 2004

Vitchev, R. (Contributor)

Activity: Participating in or organising an event typesParticipation in conference

Description

ToF-SIMS Depth Profiles of HfO2/Al2O3 Ultrathin Multilayers. Co-auteurs : L. Houssiau, T. Conard et H. Bender
Period26 Sep 2004 - 28 Sep 2004
Event typeConference
LocationMunster, Allemagne