SIMS Europe 2004

  • Roumen Vitchev (Contributor)

Activity: Participating in or organising an event typesParticipation in conference

Description

ToF-SIMS Depth Profiles of HfO2/Al2O3 Ultrathin Multilayers. Co-auteurs : L. Houssiau, T. Conard et H. Bender
Period26 Sept 200428 Sept 2004
Event typeConference
LocationMunster, AllemagneShow on map