SIMS Europe 2002

  • Roumen Vitchev (Contributor)

Activity: Participating in or organising an event types › Participation in conference

Description

Cs+ and Xe+ depth profiling of ultra-thin SiO2 and Al2O3 films of different thicknesses. Co-auteurs : L. Houssiau et J. Brison.
Period15 Sept 2002 → 17 Sept 2002
Event typeConference
LocationMunster, AllemagneShow on map