Preparation and observation of corss-sectionnal view by Transmission Electron Microscopy

    Activity: Participating in or organising an event typesParticipation in conference

    Description

    Cross-sectional TEM view was required to observe the buried carbon nitride compounds obtained by carbon and nitrogen implantation within copper matrix. This was carried out using a double-beam Focused Ion Beam (FIB) system consisting of a JEOL 5910 SEM co
    Period5 Jan 200920 Mar 2009
    Event typeOutside journey
    LocationUniversity of Salford, United Kingdom