Preparation and observation of corss-sectionnal view by Transmission Electron Microscopy

Description

Cross-sectional TEM view was required to observe the buried carbon nitride compounds obtained by carbon and nitrogen implantation within copper matrix. This was carried out using a double-beam Focused Ion Beam (FIB) system consisting of a JEOL 5910 SEM co

Period	5 Jan 2009 → 20 Mar 2009
Event type	Outside journey
Location	University of Salford, United KingdomShow on map