European PhD school on "nanoanalysis using finely focused ion and electron beams"

Douhard, B. (Participant)

Activity: Participating in or organising an event typesParticipation in workshop, seminar, course

Description

"secondary ion mass spectroscopy (SIMS), Transmission Electron Microscopy (TEM), Auger Electron Spectroscopy (AES) : a comprehensive overview"
Period21 Nov 2005
Event typeEducation
LocationBelvaux, Luxembourg